驗(yàn)證BIT測試性指標(biāo)的總線級故障注入系統(tǒng)及其設(shè)計(jì)
A bus-level fault injection system for BIT’s testability index validation and its design
-
摘要: 文章詳細(xì)分析了機(jī)內(nèi)測試(BIT, Built-in test)系統(tǒng)的測試性指標(biāo)驗(yàn)證和評價(jià)的重要性與實(shí)用性，并著重介紹了用于BIT測試性指標(biāo)驗(yàn)證的總線級故障注入系統(tǒng)及其硬件、軟件設(shè)計(jì)以及該系統(tǒng)的工作流程，并通過時(shí)序分析證明了該系統(tǒng)進(jìn)行實(shí)時(shí)故障注入的可實(shí)現(xiàn)性和可操作性，最后給出了該系統(tǒng)進(jìn)行故障注入試驗(yàn)后的軟硬件試驗(yàn)結(jié)果。Abstract: In this paper, the significance and practicability of BIT’s testability index validation and evaluation is analyzed. A bus-level fault injection system is used to validate BIT’s testability indexes and the design of the hardware, software and working flow chart of the system are discussed. The effectiveness of the real-time fault injection is shown by the schedule analysis. Finally, the test results for the hardware and software are presented.
下載: