衛(wèi)星電子組件高加速壽命試驗技術(shù)

HALT technology for satellite electronic components

摘要: 高加速壽命試驗（HALT）是一種高效的可靠性試驗。通過高加速應(yīng)力作用，激發(fā)產(chǎn)品潛在缺陷變?yōu)楣收喜⑦M行改進，以達到其在使用中幾乎不會出現(xiàn)故障的目的。文章闡述了試驗的基本原理、試驗剖面和失效分析等等，根據(jù)航天產(chǎn)品的特點，給出了應(yīng)力極限確定步驟和溫度控制方法，并將該方法在衛(wèi)星典型電子組件上進行了應(yīng)用研究。

Abstract: High Accelerating Life Test (HALT) is a kind of reliability test with high efficiency. It is used to let the potential defects of products quickly develop into failures through a highly accelerated stress action, and thus to find means to avoid those failures, so that there will be almost no failures during?the operation. This paper discusses the basic principle of this kind of test, the test profile and the failure analysis, and provides steps for determining the stress limit and the methods for temperature control according to the characteristics of spacecraft products. The applications of this test method in typical satellite electronic components are specially addressed.

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