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衛(wèi)星內(nèi)帶電效應(yīng)地面試驗(yàn)技術(shù)研究

The ground test technology of satellite internal charging effects

  • 摘要: 內(nèi)帶電效應(yīng)是導(dǎo)致航天器運(yùn)行故障和異常的主要原因之一。文章針對(duì)衛(wèi)星內(nèi)帶電效應(yīng)研究中的地面模擬試驗(yàn)技術(shù)，著重介紹了介質(zhì)輻射誘導(dǎo)電導(dǎo)率及相關(guān)參數(shù)的試驗(yàn)測(cè)量方法。基于電聲脈沖法測(cè)量介質(zhì)內(nèi)部電場(chǎng)的原理，提供了一種驗(yàn)證內(nèi)帶電仿真計(jì)算的試驗(yàn)方法。

     

    Abstract: Internal charging effect is one of the main causes of spacecraft malfunction and abnormity. This paper discusses the internal charging ground test technology, with emphases on measurement methods of radiation induced conductivity and some related material parameters. Based on the principle of internal field test by PEA, an experiment method is proposed to validate the internal charging simulation and computation.

     

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