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衛(wèi)星整星狀態(tài)下的緊縮場測試技術(shù)

Measurement Technology of Satellite Antenna and Payload in Compact Range

  • 摘要: 文章介紹了CCR 120/100緊縮場的基本原理和主要特點，該緊縮場的主、副反射面表面精度達到RMS 10～15μm，具有100 GHz以上的高頻潛在測試能力。概要講述了利用緊縮場進行衛(wèi)星整星狀態(tài)下的天線及衛(wèi)星系統(tǒng)測試的原理及方法。文章還對該緊縮場的測試誤差進行了全面的分析。

     

    Abstract: The principle and the main characteristics of CCR120/100 Compensated Compact Range are described in this paper. The surface accuracy of the main reflector and sub-reflector is RMS 10~15 μm，so the potential ability for measurement can be extended to more than 100 GHz. The test principles and test methods of the antenna and satellite RF system in Compensated Compact Range are summarized, and the test errors are analyzed.

     

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