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防靜電Kapton二次表面鏡的電子輻照效應(yīng)

The effects of electron irradiation on ITO/Kapton/Al films

  • 摘要: 文章研究防靜電Kapton二次表面鏡(ITO/Kapton/Al)在不同能量電子輻照后,太陽(yáng)吸收比退化情況,并利用X射線光電子能譜儀(XPS)和掃描電子顯微鏡(SEM)對(duì)樣品表面的成分和形貌進(jìn)行了分析。結(jié)果表明,相同電子注量下,電子能量越高,對(duì)樣品的太陽(yáng)吸收率退化作用越大;電子輻照對(duì)樣品表面形貌影響不大,但是會(huì)降低表面氧化銦錫的含量;不同能量的電子對(duì)樣品表面成分的損傷效應(yīng)是一致的。

     

    Abstract: The solar absorptance (αs) degradation of ITO/Kapton/Al films under irradiation of different energy electrons is studied. The X-ray photoelectron spectroscopy (XPS) and the scanning electronic microscope (SEM) are used to analyze the element contents and the morphologies of the samples. It is shown that the solar absorptances of the samples are degraded more severely by higher energy electron irradiation with the same irradiation flux. The morphologies of the samples are all changed little after various energy electron irradiations. The irradiation effects on the atomic contents of the samples are also discussed.

     

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