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航天電子產(chǎn)品加速壽命試驗(yàn)技術(shù)研究

Accelerated life test technique for some spaceflight electronic products

  • 摘要: 文章應(yīng)用加速壽命試驗(yàn)理論和技術(shù)，對(duì)加速壽命試驗(yàn)的類(lèi)型、參數(shù)模型以及加速方程的線(xiàn)性化等問(wèn)題進(jìn)行了分析，針對(duì)航天某電子產(chǎn)品的特點(diǎn)以及壽命分布假定，進(jìn)行了加速壽命試驗(yàn)技術(shù)應(yīng)用的研究，選擇了以溫度為應(yīng)力的恒定應(yīng)力加速壽命試驗(yàn)方案，并給出了應(yīng)力水平，闡述了基于阿倫尼斯模型的加速壽命試驗(yàn)數(shù)據(jù)統(tǒng)計(jì)分析方法。

     

    Abstract: The types and parameter models of accelerated life tests along with the linearization of acceleration equations are discussed in conjunction with related theories and techniques. For some spaceflight electronic products, the accelerated life test technology is based on the features of the products along with their age distribution A scheme of the constant stress accelerated life testing taking the temperature as a stress is proposed. The data statistical analysis is based on Arrhenius pattern.

     

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