一種串并轉(zhuǎn)換器件單粒子效應試驗研究
Test study of single event effect of a serial-input/parallel-output shift device
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摘要: 針對型號用新型器件抗輻射能力評估的需要，研制了串并轉(zhuǎn)換器件單粒子效應檢測系統(tǒng)，并對衛(wèi)星型號中準備使用的一款26位串并轉(zhuǎn)換器件進行了單粒子效應評估試驗，得到了器件抗單粒子鎖定的閾值，并發(fā)現(xiàn)該器件在單粒子輻照下會出現(xiàn)連續(xù)位輸出錯誤。結(jié)合器件版圖、結(jié)構(gòu)分析了單粒子效應造成連續(xù)位錯誤的原因，為器件廠家后續(xù)設計改進和衛(wèi)星型號進行系統(tǒng)級抗輻射加固設計提供了依據(jù)。Abstract: A single-event effect detection system is designed for testing a 26-bit serial-input/parallel- output shift device. It is shown that the device will have continuous bit errors due to the single event effect. From the design of the device, the cause of the series errors is analyzed. The result may help improve the design of the device and the radiation hardening measures for the space systems.
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