“風(fēng)云二號(hào)”衛(wèi)星天線消旋失鎖故障原因初步分析

Fault analysis of the loss of despun antenna’s lock for FY-2C satellite

摘要: 文章針對(duì)“風(fēng)云二號(hào)”C（FY-2C）衛(wèi)星的天線消旋失鎖事件，利用衛(wèi)星數(shù)據(jù)統(tǒng)計(jì)分析了事件與高能電子之間的關(guān)系,，并利用DICTAT軟件針對(duì)常用于衛(wèi)星的3種電介質(zhì)材料——聚乙烯,、聚四氟乙烯和環(huán)氧樹脂的平板和圓柱模型分別計(jì)算其內(nèi)部帶電所能產(chǎn)生的最大電場(chǎng)。結(jié)果表明：FY-2C衛(wèi)星的天線消旋失鎖事件有可能是由高能電子導(dǎo)致的介質(zhì)深層充電引起,。

Abstract: A statistical analysis of the loss of the despun antenna’s lock for FY-2C satellite is carried out in this paper, based on the satellite data, to investigate the relationship between these events and high energy electrons. By using DICTAT software, the maximum internal electric field is calculated, which is produced by electrons in planar and cylindrical polythene, teflon and epoxy dielectrics. The results show that the loss of despun antenna’s lock for FY-2C satellite is most likely caused by deep dielectric charging due to high energy electrons.